Scanning Microscopy for Forensics, Food Analysis, Medical Applications, Health and Safety
| Datum |
Montag,
17.05.2010
bis Mittwoch, 19.05.2010 |
|---|---|
| Ort | Portola Plaza Monterey |
| Kontakt | SPIE |
| info@spieeurope.org | |
| Termin zu Ihrem Kalendar hinzufügen |
vCal (Windows, Linux)
iCal (Max OS X)
|
a multidisciplinary forum that seeks to advance scanning microscopy technologies and applications.
Papers will be accepted in these technology areas:
| • | Backscattering electron diffraction |
| • | Characterization of nanoparticles |
| • | Confocal and other optical microscopy techniques |
| • | Cryo-SEM |
| • | Focused ion beam microscopy/scanning microscopy and sample modification with beams of ions |
| • | Helium ion microscopy |
| • | Fast x-ray spectrometry |
| • | Light microscopy |
| • | Materials microscopy and microanalysis |
| • | Microanalysis in SEM/EPMA/AEM |
| • | Microscopy and microanalysis: theory, instrumentation and techniques |
| • | Microwave preparation technology |
| • | Monte Carlo modeling for microscopy and microanalysis |
| • | Multidimensional microscopy |
| • | Nanotechnology and nanofabrication |
| • | SEM calibration and evaluation for nanometrology |
| • | Scanning cryo-HRSEM of chemical systems |
| • | Scanning probe microscopies |
| • | Semiconductor devices, materials, and process characterization |
| • | Silicon drift detector (SDD) EDS |
| • | STEM |
| • | TEM |
| • | Ultrahigh resolution scanning electron microscopy |
Papers will be accepted in these application areas:
| • | Agriculture |
| • | Food analysis: microstructure, identification and counter-terrorism |
| • | Forensic microscopy and microanalysis |
| • | Industrial semiconductor and nanotechnology applications of SPM |
| • | Medical applications of scanning microscopy |
| • | Museum applications |
| • | Graphic arts aspects of microscopy |
| • | Scanning microscopies for environment, health and safety aspects of engineered nanoparticles |
Planned Workshops:
| • | Electron beam/specimen interaction |
| • | Forensics |
| • | Basic SEM |
Participate at SPIE Scanning Microscopy 2010
The conference for scientists and researchers to share ideas and find technical solutions, funding sources, and personal connections that help ensure their success.
